DocumentCode :
803635
Title :
A Fully Recurrent Neural Network-Based Model for Predicting Spectral Regrowth of 3G Handset Power Amplifiers With Memory Effects
Author :
Luongvinh, Danh ; Kwon, Youngwoo
Author_Institution :
Sch. of Electr. Eng., Seoul Nat. Univ.
Volume :
16
Issue :
11
fYear :
2006
Firstpage :
621
Lastpage :
623
Abstract :
Efficient and accurate behavioral models of power amplifiers (PAs) with memory effects are important for predicting the distortions generated by PAs in 3G handsets. Conventional recurrent neural network (RNN) has been applied for RF PAs, but its capability to model PAs with memory effects has not been investigated. In this letter, we propose a new fully RNN with Gamma tapped-delay lines suitable for modeling the dynamic behavior of 3G PAs with memory effects. After being trained with wideband code division multiple access (W-CDMA) (3GPP Uplink) signals, the proposed model is validated with not only W-CDMA but also high-speed downlink packet access (3GPP Uplink) signals with higher peak-to-average ratios (PARs), which demonstrates the generality of the model. The comparisons with previous RNN models show that the proposed model offers improved performance in predicting spectral regrowth by reducing errors by 1.7-4dB
Keywords :
3G mobile communication; circuit analysis computing; code division multiple access; delay lines; mobile handsets; power amplifiers; recurrent neural nets; 3G handset power amplifiers; adjacent channel leakage ratio; behavioral modeling; high speed downlink packet access; memory effects; recurrent neural network; spectral regrowth prediction; Multiaccess communication; Peak to average power ratio; Power amplifiers; Power generation; Predictive models; Radio frequency; Radiofrequency amplifiers; Recurrent neural networks; Telephone sets; Wideband; Adjacent channel leakage ratio (ACLR); behavioral modeling; high-speed downlink packet access (HSDPA); memory effects; recurrent neural network (RNN);
fLanguage :
English
Journal_Title :
Microwave and Wireless Components Letters, IEEE
Publisher :
ieee
ISSN :
1531-1309
Type :
jour
DOI :
10.1109/LMWC.2006.884910
Filename :
1717523
Link To Document :
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