• DocumentCode
    803761
  • Title

    Capacitance Voltage Characteristics of Neutron Irradiated n+ pp+ and p+ nn+ Junctions

  • Author

    Crabbe, James S. ; Ashley, Kenneth L.

  • Author_Institution
    Texas Instruments Incorporated Dallas, Texas
  • Volume
    18
  • Issue
    6
  • fYear
    1971
  • Firstpage
    410
  • Lastpage
    419
  • Abstract
    The small signal capacitance-voltage characteristics of neutron irradiated p+ nn+ and n+ pp+ diodes are described. The capacitance characteristics were measured at frequencies of 1 kHz, 10 kHz, 100 kHz and 1 MHz for five neutron fluences. A qualitative difference in the effect of neutron fluence on the capacitance characteristics of p+ nn+ and n+ pp+ diodes is described. A computer aided device model which is based on an equivalent circuit representation of two deep defect levels is described. The capacitance characteristics of neutron irradiated pR+ nn+ diodes with three different pre-radiation resistivities were computed using the device model representation of two deep acceptor levels. The computed curves are in good agreement with the measured characteristics.
  • Keywords
    Capacitance measurement; Capacitance-voltage characteristics; Diodes; Frequency measurement; Neutrons; Resistors; Silicon; Space charge; Testing; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1971.4326462
  • Filename
    4326462