Title :
MSI Testing at Dose Rates from 109 to 1012 RAD (S1)/S
Author :
Alexander, D.R. ; Antinone, R.J.
Author_Institution :
Air Force Weapons Laboratory Kirtland AFB, New Mexico 87117
Abstract :
A group of seven different types of medium scale integrated circuits (MSI) were tested at dose rates from 109 to 1012 Rad (Si)/s. These included five types of bipolar circuits and two types of MOS circuits. Catastrophic failures were encountered in two types of bipolar circuits and one type of MOS circuit. Radiation response of all circuits is described in the following paper.
Keywords :
Circuit testing; Current supplies; Integrated circuit testing; Laboratories; Large scale integration; Power supplies; Shift registers; Signal to noise ratio; Voltage; Weapons;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1971.4326466
