Title :
Entropy methods for joint distributions in decision analysis
Author_Institution :
Sch. of Eng., Univ. of Illinois, Urbana, IL, USA
Abstract :
A fundamental step in decision analysis is the elicitation of the decision maker´s information about the uncertainties of the decision situation in the form of a joint probability distribution. This paper presents a method based on the maximum entropy principle to obtain a joint probability distribution using lower order joint probability assessments. The approach reduces the number of assessments significantly and also reduces the number of conditioning variables in these assessments. We discuss the order of the approximation provided by the maximum entropy distribution with each lower order assessment using a Monte Carlo simulation and discuss the implications of using the maximum entropy distribution in Bayesian inference. We present an application to a practical decision situation faced by a semiconductor testing company in the Silicon Valley.
Keywords :
Bayes methods; Monte Carlo methods; decision making; maximum entropy methods; semiconductor device testing; Bayesian inference; Monte Carlo simulation; Silicon Valley; decision analysis; decision maker information; eliciting probability distribution; joint probability assessment; joint probability distribution; maximum entropy principle; probabilistic dependence; project evaluation-selection; semiconductor testing company; Bayesian methods; Entropy; Information analysis; Life testing; Probability distribution; Semiconductor device testing; Silicon; Uncertainty; Decision analysis; eliciting probability distributions; maximum entropy; probabilistic dependence; project evaluation/selection;
Journal_Title :
Engineering Management, IEEE Transactions on
DOI :
10.1109/TEM.2005.861803