• DocumentCode
    804047
  • Title

    A Survey of Radiation Damage in Semiconductor Detectors

  • Author

    Goulding, Fred S. ; Pehl, Richard H.

  • Author_Institution
    Lawrence Berkeley Laboratory University of California Berkeley, California 94720
  • Volume
    19
  • Issue
    1
  • fYear
    1972
  • Firstpage
    91
  • Lastpage
    99
  • Abstract
    Examples of radiation damage in lithium-drifted detectors, lithium-drifted silicon detectors, and high-purity germanium detectors are discussed. The general patterns of damage, lithium-precipitation, annealing and recovery of detectors are outlined, and the observations are discussed.
  • Keywords
    Annealing; Educational institutions; Electron traps; Germanium; History; Laboratories; Radiation detectors; Semiconductor radiation detectors; Shape; Silicon radiation detectors;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1972.4326491
  • Filename
    4326491
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=804047