Title :
Electronic System Hardening Approaches
Author_Institution :
Systems, Science and Software La Jolla, California
Keywords :
EMP radiation effects; Electronic components; Electrons; Gamma rays; Neutrons; Nuclear weapons; Protons; Radiation effects; Radiation hardening; Semiconductor devices;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1972.4326492
