• DocumentCode
    804163
  • Title

    Computerized flow field analysis: oriented texture fields

  • Author

    Rao, A. Ravishankar ; Jain, Ramesh C.

  • Author_Institution
    Artificial Intelligence Lab., Michigan Univ., Ann Arbor, MI, USA
  • Volume
    14
  • Issue
    7
  • fYear
    1992
  • fDate
    7/1/1992 12:00:00 AM
  • Firstpage
    693
  • Lastpage
    709
  • Abstract
    An approach to the solution of signal-to-symbol transformation in the domain of flow fields, such as oriented texture fields and velocity vector fields, is discussed. The authors use the geometric theory of differential equations to derive a symbol set based on the visual appearance of phase portraits which are a geometric representation of the solution curves of a system of differential equations. They also provide the computational framework to start with a given flow field and derive its symbolic representation. Specifically, they segment the given texture, derive its symbolic representation, and perform a quantitative reconstruction of the salient features of the original texture based on the symbolic descriptors. Results of applying this technique to several real texture images are presented. This technique is useful in describing complex flow visualization pictures, defects in lumber processing, defects in semiconductor wafer inspection, and optical flow fields
  • Keywords
    computerised pattern recognition; computerised picture processing; differential equations; optical information processing; computer vision; computerised pattern recognition; differential equations; flow field analysis; flow visualization pictures; geometric theory; optical flow fields; oriented texture fields; phase portraits; semiconductor wafer inspection; signal-to-symbol transformation; symbol set; symbolic descriptors; symbolic representation; velocity vector fields; Artificial intelligence; Computer vision; Differential equations; Image segmentation; Laboratories; Least squares methods; Machinery; Signal analysis; Transforms; Vectors;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.142908
  • Filename
    142908