Title :
(110) [001] Grain Growth in Silicon Steel Sheets of 30 μm Thickness
Author :
Nakano, M. ; Agatsuma, S. ; Ishiyama, K. ; Arai, K.I.
Author_Institution :
Tohoku University.
Abstract :
Thin grain-oriented silicon steel sheets have the lowest iron loss at a thickness of 30 μm. We observed the recrystallization behavior and magnetic properties of 30 μm thick silicon steel sheets, and compared the results with those of 60 μm thick silicon steel sheets. The recrystallization processes in the two types of sheet were found to be different. The primary recrystallized 30 μm thick silicon steel sheets did not have a strong (110) [001] texture or other orientation; consequently secondary recrystallization did not occur. However, at annealing temperatures above 1050°C, (110) [001] grains grew selectively. Thus we were able to obtain very thin grain-oriented silicon steel sheets with a thickness of 30 μm.
Keywords :
Annealing; Impurities; Iron; Magnetic materials; Magnetic properties; Magnetics Society; Optical microscopy; Sheet materials; Silicon; Steel;
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
DOI :
10.1109/TJMJ.1994.4565796