DocumentCode :
804191
Title :
(110) [001] Grain Growth in Silicon Steel Sheets of 30 μm Thickness
Author :
Nakano, M. ; Agatsuma, S. ; Ishiyama, K. ; Arai, K.I.
Author_Institution :
Tohoku University.
Volume :
9
Issue :
1
fYear :
1994
Firstpage :
67
Lastpage :
72
Abstract :
Thin grain-oriented silicon steel sheets have the lowest iron loss at a thickness of 30 μm. We observed the recrystallization behavior and magnetic properties of 30 μm thick silicon steel sheets, and compared the results with those of 60 μm thick silicon steel sheets. The recrystallization processes in the two types of sheet were found to be different. The primary recrystallized 30 μm thick silicon steel sheets did not have a strong (110) [001] texture or other orientation; consequently secondary recrystallization did not occur. However, at annealing temperatures above 1050°C, (110) [001] grains grew selectively. Thus we were able to obtain very thin grain-oriented silicon steel sheets with a thickness of 30 μm.
Keywords :
Annealing; Impurities; Iron; Magnetic materials; Magnetic properties; Magnetics Society; Optical microscopy; Sheet materials; Silicon; Steel;
fLanguage :
English
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
Publisher :
ieee
ISSN :
0882-4959
Type :
jour
DOI :
10.1109/TJMJ.1994.4565796
Filename :
4565796
Link To Document :
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