• DocumentCode
    80428
  • Title

    Bubble Razor: Eliminating Timing Margins in an ARM Cortex-M3 Processor in 45 nm CMOS Using Architecturally Independent Error Detection and Correction

  • Author

    Fojtik, Matthew ; Fick, David ; Kim, Youngjae ; Pinckney, N. ; Harris, David Money ; Blaauw, D. ; Sylvester, Dennis

  • Author_Institution
    Univ. of Michigan, Ann Arbor, MI, USA
  • Volume
    48
  • Issue
    1
  • fYear
    2013
  • fDate
    Jan. 2013
  • Firstpage
    66
  • Lastpage
    81
  • Abstract
    We propose Bubble Razor, an architecturally independent approach to timing error detection and correction that avoids hold-time issues and enables large timing speculation windows. A local stalling technique that can be automatically inserted into any design allows the system to scale to larger processors. We implemented Bubble Razor on an ARM Cortex-M3 microprocessor in 45 nm CMOS without detailed knowledge of its internal architecture to demonstrate the technique´s automated capability. The flip-flop based design was converted to two-phase latch timing using commercial retiming tools; Bubble Razor was then inserted using automatic scripts. This system marks the first published implementation of a Razor-style scheme on a complete, commercial processor. It provides an energy efficiency improvement of 60% or a throughput gain of up to 100% compared to operating with worst case timing margins.
  • Keywords
    CMOS logic circuits; flip-flops; logic design; microprocessor chips; ARM Cortex-M3 microprocessor; CMOS; architecturally-independent error detection-correction; automatic scripts; bubble razor; efficiency 60 percent; energy efficiency improvement; flip-flop-based design; local stalling technique; size 45 nm; timing error correction; timing error detection; timing margin elimination; timing speculation windows; two-phase latch timing; Clocks; Delay; Error correction; Latches; Pipeline processing; Random access memory; Adaptive circuits; dynamic voltage and frequency scaling (DVFS); error correction; time borrowing; timing speculation; two-phase latches; variation tolerance;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2012.2220912
  • Filename
    6365269