Title :
A 0.25-V 28-nW 58-dB Dynamic Range Asynchronous Delta Sigma Modulator in 130-nm Digital CMOS Process
Author :
Ferreira, Luis H. C. ; Sonkusale, Sameer R.
Author_Institution :
Syst. Eng. & Inf. Technol. Inst., Fed. Univ. of Itajuba, Itajuba, Brazil
Abstract :
In this paper, we present a single-bit clock-less asynchronous delta-sigma modulator (ADSM) operating at just 0.25 V power supply. Several circuit approaches were employed to enable such low-voltage operation and maintain high performance. One approach involved utilizing bulk-driven transistors in subthreshold region with transconductance-enhancement topology. Another approach was to employ distributed transistor layout structure to mitigate the effect of low output impedance due to halo drain implants employed in today´s digital CMOS process. The ADSM achieved a characteristic center frequency of 630 Hz. It had an effective signal-to-noise-plus-distortion ratio (SNDR) of 58 dB or effective number of bits (ENOB) 9 b and just 28-nW power dissipation. A detailed analytical model capturing the effect of nonidealities of the individual circuit components is also presented for the first time with a close agreement with experimental results.
Keywords :
CMOS digital integrated circuits; MOSFET; asynchronous circuits; delta-sigma modulation; integrated circuit layout; radiofrequency integrated circuits; ADSM; ENOB; SNDR; bulk-driven transistor; digital CMOS process; distributed transistor layout structure; effective number of bits; frequency 630 Hz; low output impedance mitigation effect; low-voltage operation; noise figure 58 dB; power 28 nW; signal-to-noise-plus-distortion ratio; single-bit clock-less asynchronous delta-sigma modulator; size 130 nm; transconductance-enhancement topology; voltage 0.25 V; word length 9 bit; CMOS process; Frequency modulation; Hysteresis; Impedance; Power supplies; Transistors; Asynchronous delta-sigma modulators (ADSMs); Asynchronous delta???sigma modulators (ADSMs); bulk-driven; delta-sigma modulators; delta???sigma modulators; halo-implanted transistors; low-voltage and low-power applications; weak inversion;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2014.2330698