DocumentCode
804445
Title
The Raytheon Emissitometer
Author
Crowley, Arnold
Author_Institution
Raytheon Company, Waltham, Mass. 02173.
Issue
3
fYear
1974
Firstpage
123
Lastpage
128
Abstract
The measurement of radiation (ultra-violet, visible, or infrared) from a surface as a means of knowing the surface temperature has been found useful in many applications. One of the simpler types of instruments which uses this principle is a brightness pyrometer. The brightness pyrometer relates radiation to temperature on the basis of radiation magnitude, which is a function of temperature, but the output of the brightness pyrometer is also a function of a material property known as emissivity. While many brightness pyrometers have compensation control for different values of emissivity, knowing the emissivity constant is left for the user to find through such aids as handbooks of materials and physics texts. Even then, the emissivity may vary as a function of the particular chemical content and environment to which the material is subjected. Hence, Raytheon felt there was a need for a device to measure emissivity simultaneously with other radiation measurements and within a fraction of the time span used by the heating process.
Keywords
Bandwidth; Brightness; Circuits; Equations; Infrared heating; Instruments; Material properties; Temperature measurement; Time measurement; Wavelength measurement;
fLanguage
English
Journal_Title
Industrial Electronics and Control Instrumentation, IEEE Transactions on
Publisher
ieee
ISSN
0018-9421
Type
jour
DOI
10.1109/TIECI.1974.351204
Filename
4159008
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