DocumentCode :
804461
Title :
Modeling of an integrated active feedback preamplifier in a 0.25 μm CMOS technology at cryogenic temperatures
Author :
Saramad, Shahyar ; Anelli, Giovanni ; Bucher, Matthias ; Despeisse, Matthieu ; Jarron, Pierre ; Pelloux, Nicolas ; Rivetti, Angelo
Author_Institution :
CERN, Geneva, Switzerland
Volume :
50
Issue :
5
fYear :
2003
Firstpage :
1290
Lastpage :
1296
Abstract :
This paper describes the modeling of a standard 0.25μm CMOS technology at cryogenic temperatures. In the first step of the work, the parameters of the EKV v2.6 model were extracted at different temperatures (300, 150, and 70 K). The extracted parameters were then used to optimize the performance of a room temperature designed active feedback front-end preamplifier (AFP) at 130 K. The results show that with a small adjustment of the extracted parameters it is possible to have a reasonable model at low temperatures. By optimizing the bias conditions at 130 K, a fall time down to 1.5 ns and a double pulse resolution of 6.5 ns were measured for NA60 proton beamscope. The proposed approach will also allow a low temperature design optimization for future projects, which will not be possible using only standard models provided by the foundry.
Keywords :
CMOS digital integrated circuits; feedback; nuclear electronics; preamplifiers; 150 K; 300 K; 70 K; CMOS; EKV v2.6 model; active feedback preamplifier; bias; cryogenic temperatures; pulse resolution; CMOS technology; Cryogenics; Design optimization; Feedback; Page description languages; Preamplifiers; Pulse measurements; Semiconductor device modeling; Temperature; Time measurement;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2003.818236
Filename :
1237113
Link To Document :
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