DocumentCode
804938
Title
In Situ Observations of Magneto-Optical Spectra for Polycrystalline Co Films in Early Stage of Deposition
Author
Nakajima, K. ; Miyazaki, T.
Author_Institution
Tohoku University.
Volume
9
Issue
3
fYear
1994
Firstpage
125
Lastpage
132
Abstract
In situ measurements of the longitudinal Kerr effect were used in conjunction with ellipsometry measurements over the photon energy range from 2.0 to 4.6 eV to investigate the magneto-optic properties of polycrystalline Co films deposited on fused quartz substrates. AFM observations and ellipsometry measurements show that Co forms islands on the substrate in the early stages of deposition, and that the films become continuous in an optical sense when their thickness is about 60Ã
. The spectral shapes of both the real and imaginary parts of ¿¿xy show significant changes for 100Ã
thick films and for films less than 60Ã
thick. The dependence of the spectral shape on the Co coverage is discussed in relation to the film structure. Below 30Ã
, the calculated ¿¿xy based on formulae for the effective dielectric tensor of a composite material containing fine magnetic particles, and using the measured permittivity of a 100Ã
thick Co film, agrees well with the experimental results.
Keywords
Ellipsometry; Energy measurement; Kerr effect; Magnetic films; Magnetic properties; Magnetooptic effects; Optical films; Spectral shape; Substrates; Thickness measurement;
fLanguage
English
Journal_Title
Magnetics in Japan, IEEE Translation Journal on
Publisher
ieee
ISSN
0882-4959
Type
jour
DOI
10.1109/TJMJ.1994.4565869
Filename
4565869
Link To Document