• DocumentCode
    804938
  • Title

    In Situ Observations of Magneto-Optical Spectra for Polycrystalline Co Films in Early Stage of Deposition

  • Author

    Nakajima, K. ; Miyazaki, T.

  • Author_Institution
    Tohoku University.
  • Volume
    9
  • Issue
    3
  • fYear
    1994
  • Firstpage
    125
  • Lastpage
    132
  • Abstract
    In situ measurements of the longitudinal Kerr effect were used in conjunction with ellipsometry measurements over the photon energy range from 2.0 to 4.6 eV to investigate the magneto-optic properties of polycrystalline Co films deposited on fused quartz substrates. AFM observations and ellipsometry measurements show that Co forms islands on the substrate in the early stages of deposition, and that the films become continuous in an optical sense when their thickness is about 60Å. The spectral shapes of both the real and imaginary parts of ¿¿xy show significant changes for 100Å thick films and for films less than 60Å thick. The dependence of the spectral shape on the Co coverage is discussed in relation to the film structure. Below 30Å, the calculated ¿¿xy based on formulae for the effective dielectric tensor of a composite material containing fine magnetic particles, and using the measured permittivity of a 100Å thick Co film, agrees well with the experimental results.
  • Keywords
    Ellipsometry; Energy measurement; Kerr effect; Magnetic films; Magnetic properties; Magnetooptic effects; Optical films; Spectral shape; Substrates; Thickness measurement;
  • fLanguage
    English
  • Journal_Title
    Magnetics in Japan, IEEE Translation Journal on
  • Publisher
    ieee
  • ISSN
    0882-4959
  • Type

    jour

  • DOI
    10.1109/TJMJ.1994.4565869
  • Filename
    4565869