Title :
1 Gb/s operation and bit-error rate studies of FET-SEED diode-clamped smart-pixel optical receivers
Author :
Woodward, T.K. ; Lentine, A.L. ; Chirovsky, L.M.F.
Author_Institution :
AT&T Bell Labs., Holmdel, NJ, USA
fDate :
7/1/1995 12:00:00 AM
Abstract :
Experimental studies of the bit-error rate (BER) of diode-clamped optical receivers based on FET-SEED technology are described. 1 Gb/s operation of a receiver with optical input and electrical output is obtained. A strong dependence of the BER on clamping voltage is reported, confirming the digital nature of the receiver. The best receiver sensitivity measured at 1 Gb/s and an error rate of 1/spl times/10/sup -9/ is roughly -11 dBm. At 622 Mb/s, it is -22 dBm.<>
Keywords :
SEEDs; errors; field effect transistors; integrated optoelectronics; optical receivers; smart pixels; 1 Gbit/s; 622 Mbit/s; FET-SEED technology; bit-error rate; digital receiver; diode-clamped smart-pixel optical receivers; electrical output; optical input; sensitivity; Bit error rate; Clamps; Energy consumption; FETs; Optical buffering; Optical receivers; Optical sensors; Optical transmitters; Semiconductor diodes; Voltage;
Journal_Title :
Photonics Technology Letters, IEEE
