DocumentCode :
805070
Title :
Direct measurement of lateral carrier leakage in 1.3-μm InGaAsP multiple-quantum-well capped mesa buried heterostructure lasers
Author :
Belenky, Gregory ; Shterengas, Leon ; Reynolds, C. Lewis ; Focht, Marlin W. ; Hybertsen, Mark S. ; Witzigmann, Bernd
Author_Institution :
State Univ. of New York, Stony Brook, NY, USA
Volume :
38
Issue :
9
fYear :
2002
fDate :
9/1/2002 12:00:00 AM
Firstpage :
1276
Lastpage :
1281
Abstract :
1.3-μm InGaAsP multiple-quantum-well (MQW) capped mesa buried heterostructure (CMBH) lasers with mesa widths ranging from 1 μm (standard single mode) to 100 μm (wide area) were fabricated on one wafer with identical current blocking layers at the sides. The single-mode devices had three times larger nominal threshold current density than the wide-area devices. Measurement of gain and loss in the devices showed the single-mode devices to have 6-8 cm-1 higher loss and 40% lower optical confinement than the wide-area devices. Beyond these differences, the measurements show that up to 30% of the threshold current in the single-mode CMBH lasers does not contribute to the pumping of the MQW active region. Injection efficiency is measured to be close to unity for both single-mode and wide mesa devices. Scenarios to explain this parasitic current are discussed, including the potential role for nonradiative recombination centers at the regrown epitaxial interface, which can be consistent with all of the experimental results
Keywords :
III-V semiconductors; carrier mobility; current density; gallium arsenide; gallium compounds; indium compounds; laser modes; laser transitions; optical pumping; optical testing; quantum well lasers; semiconductor device measurement; 1.3 micron; 1.3-μm InGaAsP multiple-quantum-well capped mesa buried heterostructure lasers; 100 micron; InGaAsP; MQW active region; identical current blocking layers; injection efficiency; lateral carrier leakage; mesa widths; nominal threshold current density; nonradiative recombination centers; optical confinement; parasitic current; regrown epitaxial interface; single-mode devices; single-mode laser; standard single mode; threshold current; wide-area devices; Area measurement; Current measurement; Gain measurement; Laser modes; Loss measurement; Measurement standards; Optical devices; Optical losses; Quantum well devices; Threshold current;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2002.802161
Filename :
1027772
Link To Document :
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