DocumentCode :
805120
Title :
Bandwidth Extension Techniques for CMOS Amplifiers
Author :
Shekhar, Sudip ; Walling, Jeffrey S. ; Allstot, David J.
Author_Institution :
Dept. of Electr. Eng., Univ. of Washington, Seattle, WA
Volume :
41
Issue :
11
fYear :
2006
Firstpage :
2424
Lastpage :
2439
Abstract :
Inductive-peaking-based bandwidth extension techniques for CMOS amplifiers in wireless and wireline applications are presented. To overcome the conventional limits on bandwidth extension ratios, these techniques augment inductive peaking using capacitive splitting and magnetic coupling. It is shown that a critical design constraint for optimum bandwidth extension is the ratio of the drain capacitance of the driver transistor to the load capacitance. This, in turn, recommends the use of different techniques for different capacitance ratios. Prototype wideband amplifiers in 0.18-mum CMOS are presented that achieve a measured bandwidth extension ratio up to 4.1 and simultaneously maintain high gain (>12 dB) in a single stage. Even higher enhancement ratios are shown through the introduction of a modified series-peaking technique combined with staggering techniques. Ultra-wideband low-noise amplifiers in 0.18-mum CMOS are presented that exhibit bandwidth extension ratios up to 4.9
Keywords :
CMOS integrated circuits; low noise amplifiers; radio receivers; ultra wideband communication; 0.18 micron; CMOS amplifiers; CMOS integrated circuit; T-coil; bandwidth extension; capacitive splitting; drain capacitance; driver transistor; inductive-peaking; magnetic coupling; ultra-wideband low-noise amplifiers; wireless applications; wireline applications; Bandwidth; Broadband amplifiers; CMOS technology; Capacitance; Couplings; Driver circuits; Gain measurement; Low-noise amplifiers; Prototypes; Ultra wideband technology; Bandwidth extension; T-coil; low-noise amplifier; low-power; peaking; staggering; transformer; ultra-wideband (UWB); wireless; wireline;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2006.883336
Filename :
1717666
Link To Document :
بازگشت