• DocumentCode
    805296
  • Title

    Current practice in space charge and polarization profile measurements using thermal techniques

  • Author

    Bauer, Siegfried ; Bauer-Gogonea, Simona

  • Author_Institution
    Soft Matter Phys., Johannes Kepler Univ., Linz, Austria
  • Volume
    10
  • Issue
    5
  • fYear
    2003
  • Firstpage
    883
  • Lastpage
    902
  • Abstract
    Thermal techniques for probing space charge and electric field distributions in dielectric materials became available approximately 30 years ago. The techniques have reached maturity and they have been employed not only for the primary purpose of electric field or polarization profiling, but also in a wide range of problems posed by materials research. The present survey provides an overview of the historical development, the experimental implementation of the different techniques, the theoretical foundation, methods for the data analysis and a comparison of thermal and acoustic techniques. The thermal wave technique LIMM is used as an example among the thermal techniques, for a discussion of data analysis techniques and for the spatial resolution that can be achieved with thermal wave techniques. A tour d´horizon is provided through recent applications of thermal techniques, in order to demonstrate their capabilities for dielectric material characterisation.
  • Keywords
    dielectric materials; dielectric measurement; dielectric polarisation; photothermal effects; space charge; LIMM; data analysis; dielectric material; electric field distribution; polarization profile measurement; space charge profile measurement; spatial resolution; thermal technique; thermal wave technique; Charge measurement; Current measurement; Deconvolution; Dielectric materials; Dielectric measurements; Polarization; Signal analysis; Space charge; Spatial resolution; Transient analysis;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2003.1237336
  • Filename
    1237336