DocumentCode :
805635
Title :
Known good die meets chip size package
Author :
Gilg, Larry
Author_Institution :
R & D Div., MCC, Austin, TX, USA
Volume :
11
Issue :
4
fYear :
1995
fDate :
7/1/1995 12:00:00 AM
Firstpage :
32
Lastpage :
37
Abstract :
The increasing density, functionality, and high speed performance of integrated circuit components are fueling demands for smaller and faster portable electronic systems. Designers are becoming more experienced at cutting size, delays, and costs wherever possible. One area that offers attractive benefits for reducing size and improving performance is in the IC package itself, either eliminating it altogether, or reducing the size to the point where it takes up very little more space than the IC. In that context, chip size packages (CSPs) offer a viable solution to the problem. The electrical performance of a circuit is degraded by any capacitance, inductance, and lead length added to the IC bond pads. In addition to the performance limitations of the IC package itself, the larger footprint of the package implies that the next level of interconnect will also be sub optimal due to size and fanout of the IC interconnections. CSPs address these problems, too
Keywords :
integrated circuit packaging; surface mount technology; CSPs; IC interconnections; IC package; chip size package; electrical performance; fanout; known good die; performance limitations; Bonding; Capacitance; Costs; Degradation; Delay; Electronics packaging; High speed integrated circuits; Inductance; Integrated circuit interconnections; Integrated circuit packaging;
fLanguage :
English
Journal_Title :
Circuits and Devices Magazine, IEEE
Publisher :
ieee
ISSN :
8755-3996
Type :
jour
DOI :
10.1109/101.395195
Filename :
395195
Link To Document :
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