DocumentCode
805635
Title
Known good die meets chip size package
Author
Gilg, Larry
Author_Institution
R & D Div., MCC, Austin, TX, USA
Volume
11
Issue
4
fYear
1995
fDate
7/1/1995 12:00:00 AM
Firstpage
32
Lastpage
37
Abstract
The increasing density, functionality, and high speed performance of integrated circuit components are fueling demands for smaller and faster portable electronic systems. Designers are becoming more experienced at cutting size, delays, and costs wherever possible. One area that offers attractive benefits for reducing size and improving performance is in the IC package itself, either eliminating it altogether, or reducing the size to the point where it takes up very little more space than the IC. In that context, chip size packages (CSPs) offer a viable solution to the problem. The electrical performance of a circuit is degraded by any capacitance, inductance, and lead length added to the IC bond pads. In addition to the performance limitations of the IC package itself, the larger footprint of the package implies that the next level of interconnect will also be sub optimal due to size and fanout of the IC interconnections. CSPs address these problems, too
Keywords
integrated circuit packaging; surface mount technology; CSPs; IC interconnections; IC package; chip size package; electrical performance; fanout; known good die; performance limitations; Bonding; Capacitance; Costs; Degradation; Delay; Electronics packaging; High speed integrated circuits; Inductance; Integrated circuit interconnections; Integrated circuit packaging;
fLanguage
English
Journal_Title
Circuits and Devices Magazine, IEEE
Publisher
ieee
ISSN
8755-3996
Type
jour
DOI
10.1109/101.395195
Filename
395195
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