DocumentCode :
805700
Title :
Characterization of hard- and soft-switching performance of high-voltage Si and 4H-SiC PiN diodes
Author :
Shenai, Krishna ; Trivedi, Malay ; Neudeck, Philip G.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
Volume :
49
Issue :
9
fYear :
2002
fDate :
9/1/2002 12:00:00 AM
Firstpage :
1648
Lastpage :
1656
Abstract :
This paper presents a study of the performance of high-voltage Si and 4H-SiC diodes in a DC-DC buck converter. Device operation in both hard- and zero-voltage switching conditions is presented with the help of measurements and two-dimensional (2-D) mixed device-circuit simulations. Experimental results show that SiC PiN diodes have a strong potential for use in high-speed high-voltage power electronics applications operating at high temperature. A combination of low excess carrier concentration and low carrier lifetime results in superior switching performance of the 4H-SiC diode over ultrafast Si diodes. Soft switching is shown to minimize the switching loss and allow operation at higher switching frequencies using Si diodes. The power loss of 4H-SiC diodes is dominated by conduction loss. Consequently, soft-switching techniques result in a marginal reduction in power loss. However, the low overall power loss implies that SiC diodes can be used at very high switching frequencies even in hard-switching configurations.
Keywords :
DC-DC power convertors; carrier density; elemental semiconductors; high-temperature electronics; losses; p-i-n diodes; power semiconductor diodes; power semiconductor switches; semiconductor device models; silicon; silicon compounds; wide band gap semiconductors; 2D mixed device-circuit simulations; 4H-SiC HV PIN diodes; DC-DC buck converter; Si; Si HV PIN diodes; SiC; conduction loss; hard-switching performance; high temperature operation; high-speed HV power electronics applications; high-voltage p-i-n diodes; low carrier lifetime; low excess carrier concentration; power loss; soft-switching performance; switching frequencies; switching loss; switching performance; zero-voltage switching conditions; Buck converters; Charge carrier lifetime; Diodes; Power electronics; Silicon carbide; Switching frequency; Switching loss; Temperature; Two dimensional displays; Zero voltage switching;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2002.802645
Filename :
1027855
Link To Document :
بازگشت