Title :
New beginnings, continued success
Author :
Kwang-Ting Tim Cheng
Abstract :
In his first EIC message as D&T´s new editor in chief, Tim Cheng notes that D&T has developed strong relationships with key electronic-design and test communities over the past several years. Such partnerships help to broaden the readership and further strengthen D&T´s position as the leading magazine for the professional design, test, and design automation communities.
Keywords :
dependability analysis; design and test; design debugging; design for testability; heterogeneous systems; jitter-tolerance testing; nanometer technology; transistor mismatch; Automatic testing; Design engineering; Design for testability; Electronic design automation and methodology; Electronic equipment testing; Feedback; Filters; Jitter; Maintenance engineering; System testing; dependability analysis; design and test; design debugging; design for testability; heterogeneous systems; jitter-tolerance testing; nanometer technology; transistor mismatch;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2006.21
