Title :
Current Mode Image Sensor With Improved Linearity and Fixed-Pattern Noise
Author :
Xiaotie Wu ; Xilin Liu ; Milin Zhang ; Van der Spiegel, Jan
Author_Institution :
Dept. of Electr. & Syst. Eng. (ESE), Univ. of Pennsylvania, Philadelphia, PA, USA
Abstract :
Current mode active pixel sensors convert light intensity into an analog output current. A current mode image sensor enables simple implementation of focal plane algebraic functions but suffers from poor linearity and large fixed-patten noise. This paper analyzes the causes of the non-linearity of a current-mode image sensor including a theoretical derivation and numerical simulation. Previously reported linearity improvement methods are reviewed, while an architecture of a current mode image sensor with a voltage feedback loop between pixel output and the current conveyor for linearity enhancement is proposed. An image sensor array of 100 × 200 current mode pixels is fabricated in a 0.5 μm 2P3M standard CMOS processing technology. Experimental results illustrate a 45% improvement of the linearity of the proposed imager. Fixed pattern noise is reduced by 57.6% for the maximum readout current, which can be further reduced by another 51.5% after gain calibration. A signal to noise ratio of 49.6 dB is achieved.
Keywords :
CMOS image sensors; calibration; current conveyors; electric sensing devices; focal planes; integrated circuit noise; numerical analysis; readout electronics; sensor arrays; 2P3M standard CMOS processing technology; analog output current; current conveyor; current mode active pixel image sensor array; fixed-patten noise; focal plane algebraic function; gain calibration; linearity improvement method; maximum readout current; numerical simulation; size 0.5 mum; voltage feedback loop; Arrays; Image sensors; Linearity; Noise; Resistance; Standards; Transistors; Current mode image sensor; fixed-pattern noise; linear response;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2013.2295009