Conference Reports: 2005 International Test Conference

The 36th annual IEEE International Test Conference convened from 8 to 10 November 2005 in Austin, Texas. The location was a significant move for ITC: It was the first time the conference had met west of the Mississippi, as ITC\´s general chair Rob Aitken pointed out during his introduction at the plenary session. The conference theme, "Test: Survival of the Fittest," called to mind the test industry\´s rapidly evolving and increasingly competitive nature, especially of recent years.