• DocumentCode
    805864
  • Title

    High-resolution electron beam lithography and DNA nano-patterning for molecular QCA

  • Author

    Hu, Wenchuang ; Sarveswaran, Koshala ; Lieberman, Marya ; Bernstein, Gary H.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Notre Dame, IN, USA
  • Volume
    4
  • Issue
    3
  • fYear
    2005
  • fDate
    5/1/2005 12:00:00 AM
  • Firstpage
    312
  • Lastpage
    316
  • Abstract
    Electron beam lithography (EBL) patterning of poly(methylmethacrylate) (PMMA) is a versatile tool for defining molecular structures on the sub-10-nm scale. We demonstrate lithographic resolution to about 5 nm using a cold-development technique. Liftoff of sub-10-nm Au nanoparticles and metal lines proves that cold development completely clears the PMMA residue on the exposed areas. Molecular liftoff is performed to pattern DNA rafts with high fidelity at linewidths of about 100 nm. High-resolution EBL and molecular liftoff can be applied to pattern Creutz-Taube molecules on the scale of a few nanometers for quantum-dot cellular automata.
  • Keywords
    DNA; cellular automata; electron beam lithography; gold; molecular biophysics; nanoparticles; nanopatterning; polymers; quantum dots; Au; Au nanoparticles; Creutz-Taube molecules; DNA nanopatterning; cold-development technique; electron beam lithography patterning; high-resolution electron beam lithography; metal grains; molecular electronics; molecular liftoff; molecular quantum-dot cellular automata; molecular structures; nanofabrication; poly(methylmethacrylate); DNA; Electron beams; Lithography; Manufacturing; Molecular beams; Molecular electronics; Nanoparticles; Quantum cellular automata; Quantum dots; Self-assembly; Au nanoparticles; DNA tiling; electron beam lithography (EBL); liftoff; metal grains; molecular electronics; nanofabrication; quantum-dot cellular automata (QCA);
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2005.847034
  • Filename
    1430665