Title :
Nanoscale memory elements based on solid-state electrolytes
Author :
Kozicki, Michael N. ; Park, Mira ; Mitkova, Maria
Author_Institution :
Center for Solid-State Electron. Res., Arizona State Univ., Tempe, AZ, USA
fDate :
5/1/2005 12:00:00 AM
Abstract :
We report on the fabrication and characterization of nanoscale memory elements based on solid electrolytes. When combined with silver, chalcogenide glasses such as Se-rich Ge-Se are good solid electrolytes, exhibiting high Ag ion mobility and availability. By placing an anode that has oxidizable Ag and an inert cathode (e.g., Ni) in contact with a thin layer of such a material, a device is formed that has an intrinsically high resistance, but which can be switched to a low-resistance state at small voltage via reduction of the silver ions. An opposite bias will return the device to a high-resistance state, and this reversible switching effect is the basis of programmable metallization cell technology. In this paper, electron beam lithography was used to make sub-100-nm openings in polymethylmethacrylate layers used as the dielectric between the device electrodes. The solid electrolyte film was formed in these via-holes so that their small diameter defined the active switching area between the electrodes. The Ag-Ge-Se electrolyte was created by the photodiffusion, with or without thermal assistance, of an Ag layer into the Ge-Se base glass. Combined thermal and photodiffusion leads to a nanophase separated material with a dispersed Ag ion-rich material with an average crystallite size of 7.5 nm in a glassy insulating Ge-rich continuous phase. The nanoscale devices write at an applied bias as low as 0.2 V, erase by -0.5 V, and fall from over 107 Ω to a low-resistance state (e.g., 104 Ω for a 10-μA programming current) in less than 100 ns. Cycling appears excellent with projected endurance well beyond 1011 cycles.
Keywords :
Dember effect; chalcogenide glasses; electron beam lithography; germanium alloys; ion mobility; metallic thin films; nanoelectronics; nanostructured materials; nickel; polymer films; random-access storage; selenium alloys; silver alloys; solid electrolytes; -0.5 V; 0.2 V; 100 nm; 100 ns; 104 ohm; 107 ohm; 7.5 nm; Ag-Ge-Se electrolyte; AgGeSe; Ni; active switching area; chalcogenide glasses; device electrodes; dielectric; dispersed Ag ion-rich material; electrical switching; electron beam lithography; glassy insulating Ge-rich continuous phase; high Ag ion mobility; high-resistance state; inert cathode; low-resistance state; nanophase separated material; nanoscale devices; nanoscale memory elements; nanostructured materials; nonvolatile memory; photodiffusion; polymethylmethacrylate layers; programmable metallization cell technology; reversible switching effect; silver; solid electrolyte film; solid-state electrolytes; thermal assistance; via holes; Anodes; Availability; Cathodes; Contact resistance; Crystalline materials; Electrodes; Fabrication; Glass; Silver; Solid state circuits; Electrical switching; nanoscale devices; nanostructured materials; nonvolatile memory; solid-state electrolytes;
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2005.846936