Title :
Preparation of ferroelectric Ba(Ti0.85Sn0.15)O3 thin films by metal-organic decomposition
Author :
Miyamoto, T. ; Murakami, S. ; Inoue, K. ; Suzuki, Y. ; Nomura, T. ; Popovici, D. ; Noda, M. ; Okuyama, M.
Author_Institution :
Mater. Technol. Dept., Technol. Res. Inst. of Osaka Prefecture, Japan
fDate :
6/1/2005 12:00:00 AM
Abstract :
Ferroelectric Ba(Ti0.85Sn0.15)O3 (BTS15) thin film is newly prepared on the Pt/Ti/SiO2/Si substrate by metal-organic decomposition. The firing condition is determined by thermogravimetric and differential thermal analysis. The BTS15 thin film with a flat surface and uniform thickness is obtained by spin coating in N2 atmosphere that avoids moisture. The BTS15 film has a perovskite phase and a preferential [110] texture. It is also found that the crystalline structure is cubic at 24°C with a lattice constant of 4.01 Å, and a grain size of about 30 nm was estimated by Scherrer equation and SEM image. From P-E hysteresis loop at 20°C, the polarization at E=0 and the electric field at P=0 are found to be 1.07 μC/cm2 and 24.0 kV/cm, respectively. It is observed that the dielectric constant decreases monotonously from about 830 to 630 with increasing temperature ranging from 20°C to 50°C. Finally, it is found that the BTS15 thin film shows a sufficient ferroelectricity and is an attractive material for functional ferroelectric devices, such as thermal-type infrared sensors.
Keywords :
barium compounds; ferroelectric ceramics; ferroelectric devices; ferroelectric thin films; ferroelectricity; infrared detectors; spin coating; thermal analysis; tin compounds; titanium compounds; 30 nm; Ba(Ti0.85Sn0.15)O3; N2; Perovskite phase; SEM image; Scherrer equation; crystalline structure; dielectric constant; differential thermal analysis; electric field; ferroelectric thin films; ferroelectricity; functional ferroelectric devices; infrared sensors; lattice constant; metal-organic decomposition; micromachining; polarization; preferential texture; spin coating; thermal sensor; thermogravimetric analysis; Atmosphere; Coatings; Ferroelectric materials; Firing; Grain size; Moisture; Semiconductor thin films; Substrates; Tin; Transistors; Ferroelectric thin film; infrared sensors; micromachining;
Journal_Title :
Sensors Journal, IEEE
DOI :
10.1109/JSEN.2004.841872