• DocumentCode
    806354
  • Title

    System-on-a-chip test scheduling with precedence relationships, preemption, and power constraints

  • Author

    Iyengar, Vikram ; Chakrabarty, Krishnendu

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
  • Volume
    21
  • Issue
    9
  • fYear
    2002
  • fDate
    9/1/2002 12:00:00 AM
  • Firstpage
    1088
  • Lastpage
    1094
  • Abstract
    Test scheduling is an important problem in system-on-a-chip (SOC) test automation. Efficient test schedules minimize the overall system test application time, avoid test resource conflicts, and limit power dissipation during test mode. In this paper, we present an integrated approach to several test scheduling problems. We first present a method to determine optimal schedules for reasonably sized SOCs with precedence relationships, i.e., schedules that preserve desirable orderings among tests. We also present an efficient heuristic algorithm to schedule tests for large SOCs with precedence constraints in polynomial time. We describe a novel algorithm that uses preemption of tests to obtain efficient schedules for SOCs. Experimental results for an academic SOC and an industrial SOC show that efficient test schedules can be obtained in reasonable CPU time
  • Keywords
    application specific integrated circuits; automatic testing; integrated circuit testing; linear programming; logic testing; low-power electronics; SOCs; desirable orderings; embedded core testing; heuristic algorithm; polynomial time; power constraints; power dissipation; precedence relationships; preemption; system-on-a-chip test automation; test resource conflicts; test schedules; Automatic testing; Automation; Heuristic algorithms; Job shop scheduling; Optimal scheduling; Polynomials; Power dissipation; Scheduling algorithm; System testing; System-on-a-chip;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2002.801102
  • Filename
    1028108