DocumentCode
806354
Title
System-on-a-chip test scheduling with precedence relationships, preemption, and power constraints
Author
Iyengar, Vikram ; Chakrabarty, Krishnendu
Author_Institution
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
Volume
21
Issue
9
fYear
2002
fDate
9/1/2002 12:00:00 AM
Firstpage
1088
Lastpage
1094
Abstract
Test scheduling is an important problem in system-on-a-chip (SOC) test automation. Efficient test schedules minimize the overall system test application time, avoid test resource conflicts, and limit power dissipation during test mode. In this paper, we present an integrated approach to several test scheduling problems. We first present a method to determine optimal schedules for reasonably sized SOCs with precedence relationships, i.e., schedules that preserve desirable orderings among tests. We also present an efficient heuristic algorithm to schedule tests for large SOCs with precedence constraints in polynomial time. We describe a novel algorithm that uses preemption of tests to obtain efficient schedules for SOCs. Experimental results for an academic SOC and an industrial SOC show that efficient test schedules can be obtained in reasonable CPU time
Keywords
application specific integrated circuits; automatic testing; integrated circuit testing; linear programming; logic testing; low-power electronics; SOCs; desirable orderings; embedded core testing; heuristic algorithm; polynomial time; power constraints; power dissipation; precedence relationships; preemption; system-on-a-chip test automation; test resource conflicts; test schedules; Automatic testing; Automation; Heuristic algorithms; Job shop scheduling; Optimal scheduling; Polynomials; Power dissipation; Scheduling algorithm; System testing; System-on-a-chip;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2002.801102
Filename
1028108
Link To Document