Title :
Flexible TFT Circuit Analyzer Considering Process Variation, Aging, and Bending Effects
Author :
En-Hua Ma ; Wen-En Wei ; Hung-Yi Li ; Li, James Chien-Mo ; Cheng, I-Chun ; Yung-Hui Yeh
Author_Institution :
Synopsys, Chupei, Taiwan
Abstract :
This paper presents a SPICE-based simulator, FlexiAnalyzer, for flexible thin-film transistor (TFT) circuits. This simulator performs four types of analysis: yield analysis, aging analysis, performance analysis, and weak spot analysis. This simulator considers three important effects: 1) threshold voltage variation of manufacturing process; 2) threshold voltage shift due to aging effect; and 3) mobility change due to bending effect. Six different OLED pixel drivers designed in 8- μm amorphous silicon TFT technology were used in simulation results. The proposed tool provides a good solution for designers to evaluate the performance and yield of flexible TFT circuits.
Keywords :
SPICE; ageing; computerised instrumentation; driver circuits; elemental semiconductors; network analysis; organic light emitting diodes; performance evaluation; silicon; thin film transistors; OLED pixel driver; SPICE-based simulator; Si; aging analysis; bending effect; flexible TFT circuit analyzer; flexible thin-film transistor circuit; manufacturing process; size 8 mum; threshold voltage shift; threshold voltage variation; weak spot analysis; yield analysis; Aging; Equations; Integrated circuit modeling; Mathematical model; Organic light emitting diodes; Thin film transistors; Flexible TFT circuits; aging effect; bending effect; circuit analyzer; spice;
Journal_Title :
Display Technology, Journal of
DOI :
10.1109/JDT.2013.2277590
