Title :
Weibull statistical analysis of area and volume effects on the breakdown strength in liquid nitrogen
Author :
Goshima, H. ; Hayakawa, N. ; Hikita, M. ; Okubo, H. ; Uchida, K.
Author_Institution :
Nagoya Univ., Japan
fDate :
6/1/1995 12:00:00 AM
Abstract :
In order to examine the area and the volume effects on breakdown strength in liquid nitrogen (LN2), we measured dc and ac breakdown voltages in LN2 with sphere to plane and coaxial cylindrical electrode configurations. We also carried out statistical analysis of the experimental results using the Weibull distribution and discussed with the statistical stressed electrode area (SSEA) and/or liquid volume (SSLV). The dc and ac breakdown strength in LN2 decreased to 1/5 with increasing SSEA and SSLV over the wide range from 100to 105 mm2 and from 10-1 to 105 mm3, respectively. The Weibull shape parameter m for the sphere to plane and the coaxial cylindrical electrodes was estimated to be 6 to 8 and 11 to 13, respectively; the breakdown strength in LN2 saturated with increasing SSEA and SSLV. From these results, it was verified that the area and the volume effects definitely determined the breakdown strength in LN2. The results of the Weibull statistics were compared with the conventional concept of the stressed electrode area (SEA) and liquid volume (SLV). Consequently, SSEA or SSLV was found to be nearly equal to 80 to 85% of SEA or SLV
Keywords :
Weibull distribution; dielectric liquids; electric breakdown; electric strength; nitrogen; AC breakdown voltage; DC breakdown voltage; N2; Weibull distribution; Weibull shape parameter; Weibull statistical analysis; area effects; breakdown strength; coaxial cylindrical electrode configuration; liquid N2; sphere to plane electrode configuration; statistical stressed electrode area; statistical stressed liquid volume; volume effects; Area measurement; Breakdown voltage; Coaxial components; Electric breakdown; Electrodes; Nitrogen; Sea measurements; Statistical analysis; Volume measurement; Weibull distribution;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on