Title :
Built-in-test in support system maintenance
Author :
Drees, Ronald ; Young, Neal
fDate :
9/1/2002 12:00:00 AM
Abstract :
This article looks at the state of BIT (built-in-test) in test and measurement instruments, explains BIT´s effect on system readiness, and presents ideas on how to improve BIT technologies and standards. The following topics are discussed: circuit level BIT (built-in self-test); module level and line replaceable units (LRU); system-level self-contained testing; instrumentation BIT history; BIT fault coverage and isolation in support system maintenance; BIT development process; pitfalls and limitations of BIT; BIT effectiveness in support system maintenance and availability.
Keywords :
automatic test equipment; automatic test software; built-in self test; fault location; instruments; maintenance engineering; modules; standards; BIST; BIT development process; BIT limitations; BIT standards; BIT technologies; LRU; built-in self-test; circuit level BIT; electronic systems built-in-test; fault coverage; fault isolation; instrumentation BIT; line replaceable units; measurement instruments; module level units; support system maintenance; system-level self-contained testing; test instruments; Aerospace electronics; Assembly; Automatic control; Automatic test equipment; Automatic testing; Built-in self-test; Circuit testing; Costs; Instruments; System testing;
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
DOI :
10.1109/MIM.2002.1028369
