Title :
New wideband optical modulation method for measurement of intrinsic frequency response in semiconductor lasers
Author :
Murata, Shotaro ; Suzuki, A.
Author_Institution :
NEC Corp., Tsukuba, Japan
Abstract :
A new wideband optical modulation method is described for measurement of the intrinsic frequency response is semiconductor lasers. The measurement bandwidth is more than 40 GHz. The main feature of the method is the detection technique which uses a microwave detector and a lock-in amplifier. The 3 dB modulation bandwidth for a 1.5 mu m strained multiquantum well laser measured by this method is 28 GHz.
Keywords :
frequency response; laser variables measurement; optical modulation; semiconductor lasers; 1.5 micron; 28 GHz; 40 GHz; detection technique; intrinsic frequency response; lock-in amplifier; measurement bandwidth; microwave detector; modulation bandwidth; semiconductor lasers; wideband optical modulation;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19921388
