DocumentCode :
807093
Title :
Built-in-test for processor-based modules
Author :
Ferraro, John
Volume :
5
Issue :
3
fYear :
2002
fDate :
9/1/2002 12:00:00 AM
Firstpage :
39
Lastpage :
42
Abstract :
This article describes a software methodology for built-in-test (BIT) for processor based modules. Firstly, an example of the hardware comprising a common processor module is given. This is followed by a description of the BIT software architecture and details of the component elements: the test executive, which integrates all the components and provides the interface to external applications and boot programs; the BIT reconfiguration table, for test control flexibility; test result handling; and the individual test functions, written in both assembly language and C. This BIT product is extremely flexible, portable, and very thorough are high fault detection, high isolation coverage, and support for unique test requirements
Keywords :
C language; assembly language; built-in self test; computer bootstrapping; computer interfaces; computer testing; fault location; microcomputers; modules; reconfigurable architectures; software architecture; software portability; BIT reconfiguration table; BIT software architecture; C language; assembly language; boot programs; built-in-test software methodology; external application interface; fault detection; fault isolation coverage; flexible test control; portable software; processor module hardware; processor-based modules; software component integration; test executive; test functions; test result handling; Application software; Bridge circuits; Computer architecture; Fault detection; Hardware; Nonvolatile memory; Operating systems; Product development; Software testing; System testing;
fLanguage :
English
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
Publisher :
ieee
ISSN :
1094-6969
Type :
jour
DOI :
10.1109/MIM.2002.1028371
Filename :
1028371
Link To Document :
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