Title :
Mode hopping noise in coherent FMCW reflectometry
Author :
Passy, R. ; Gisin, Nicolas ; von der Weid, J.P.
Author_Institution :
Geneva Univ., Switzerland
Abstract :
The effect of mode hopping in FMCW reflectometry is discussed. Numerical simulations and experimental results are compared and are shown to have good agreement. A simple formula to predict and position of spurious noise peaks is presented.
Keywords :
frequency modulation; noise; reflectometry; coherent FMCW reflectometry; mode hopping; spurious noise peaks;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19921403
