DocumentCode :
807304
Title :
Terminal Modeling and Photocompensation of Complex Microcircuits
Author :
Pocock, D.N. ; Krebs, M.G.
Author_Institution :
Northrop Corporate Laboratories Hawthorne, California 90250
Volume :
19
Issue :
6
fYear :
1972
Firstpage :
86
Lastpage :
93
Abstract :
Results are presented on generalized approaches to derive radiation-inclusive simplified models of linear and digital microcircuits. Application of the principle of superposition allows generation of a compact small-signal model of the linear microcircuit, with extension of the model to include large-signal saturation effects. The digital microcircuit model is the combination of current-voltage terminal networks with a logical decision function to represent the truth table of the device. A factor of 20 to 50 improvement in required computer time and storage was realized with the terminal models over detailed models, with no significant loss in the representation of key performance parameters or radiation vulnerability. The linear modeling technique suggests that photocompensation networks can be applied successfully at the terminals of the device.
Keywords :
Admittance; Circuit analysis computing; Computer aided analysis; Equations; Ionizing radiation; Laboratories; Large scale integration; Performance loss; Photoconductivity; Voltage;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1972.4326813
Filename :
4326813
Link To Document :
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