Title :
Analytical Techniques for the Determination of Equipment Probability of Survival to Radiation Stress
Author :
Young, L.S. ; Vassallo, F.A. ; Kleiner, C.T.
Author_Institution :
North American Rockwell Electronics Group Anaheim, California 92803
Abstract :
Two analytical techniques (Monte Carlo and Small Sample Theory) are described which have been used to produce a survivability function, PS(RS), for equipment subject to a radiation stress, RS. The methods have been used for permanent damage due to neutron fluence and transient upset due to ionizing radiation. The methods are illustrated using a series regulator circuit. The techniques are sufficiently general such that they are applicable to a variety of environmental stresses.
Keywords :
Area measurement; Assembly; Character generation; Circuits; Ionizing radiation; Neutrons; Stress; Systems engineering and theory; Testing; Transient analysis;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1972.4326817