DocumentCode :
807373
Title :
Bias is not bad
Author :
Evans, Ralph A.
Volume :
51
Issue :
3
fYear :
2002
Firstpage :
257
Lastpage :
257
Keywords :
Arithmetic; Life estimation; Reliability engineering; Size measurement; Statistics;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2002.802882
Filename :
1028395
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=807373