DocumentCode :
807446
Title :
Absolute Yields of X-Ray Induced Photoemission from Metals
Author :
Bradford, John N.
Author_Institution :
Air Force Cambridge Research Laboratories (AFSC) L. G. Hanscom Field, Bedford, Mass. 01730
Volume :
19
Issue :
6
fYear :
1972
Firstpage :
167
Lastpage :
171
Abstract :
Absolute electron yields from tantalum, molybdenum, copper and aluminum have been measured for several x-ray bombarding geometries. The photon spectra used were derived from filtered bremsstrahlung generated in a tungsten anode at 50 KV, constant potential. The electron spectra were measured by a cylindrical electrostatic analyzer with a secondary emission detector. The spectra exhibit both Auger and scattered photoelectrons.
Keywords :
Aluminum; Anodes; Copper; Detectors; Electron emission; Electrostatic analysis; Electrostatic measurements; Geometry; Photoelectricity; Tungsten;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1972.4326827
Filename :
4326827
Link To Document :
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