Title :
Permanent and Transient Radiation Effects in Baritt Microwave Oscillators
Author_Institution :
Sandia Laboratories Albuquerque, New Mexico
Keywords :
Acoustical engineering; Electron traps; Gunn devices; Microwave devices; Microwave oscillators; Neodymium; Neutrons; Radiation effects; Silicon; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1972.4326852
