Title :
Effect of contact recombination on the transverse conductivity distribution in photoexcited semiconductor coplanar waveguides
Author_Institution :
Dept. of High-Frequency & Optoelectron. Eng., Univ. of the Federal Armed Forces, Hamburg, Germany
fDate :
2/1/1996 12:00:00 AM
Abstract :
A modified 1-D approximation for the 2-D diffusion-controlled distribution of photoconductivity in the cross-sectional region of illuminated semiconductor coplanar waveguides (CPW) is presented, taking into account contact recombination at the strip and ground plane metallisation
Keywords :
coplanar waveguides; electron-hole recombination; photoconductivity; waveguide theory; 1D approximation; 2D diffusion; contact recombination; ground plane metallisation; optical microwave control; photoconductivity; photoexcited semiconductor coplanar waveguide; strip metallisation; transverse conductivity distribution;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19960155
