DocumentCode
80778
Title
XPS and PIXE Analysis of Doped Silica Fibre for Radiation Dosimetry
Author
Abdul Sani, S.F. ; Mahdiraji, G. Amouzad ; Siti Shafiqah, A.S. ; Grime, G.W. ; Palitsin, V. ; Hinder, S.J. ; Tamchek, N. ; Abdul Rashid, H.A. ; Maah, M.J. ; Watts, J.F. ; Bradley, D.A.
Author_Institution
Dept. of Phys., Univ. of Surrey, Guildford, UK
Volume
33
Issue
11
fYear
2015
fDate
June1, 1 2015
Firstpage
2268
Lastpage
2278
Abstract
The material characteristics of doped SiO2 fibre are studied, the electron traps in the product medium creating a situation attractive for their application in thermoluminescence (TL) radiation dosimetry. To date, rather limited research has been conducted towards gaining an essential understanding of the magnitude of TL signal and material characteristics of doped fibres. Characterization is being sought to ensure that the mechanism of TL yield in optical fibres is well understood, allowing a favourable well controlled production situation to be established. The intended end point is to specify dosimeters, not only for clinical dosimetry but also for their application in industrial/energy-industry settings. Investigation of the surface oxidation state of the Ge-doped SiO2 optical preform has been carried out using the X-ray photoelectron spectroscopy technique. In a further development using the fibre forming technology, particle-induced X-ray emission/Rutherford back scattering measurements have been employed to ascertain dopant concentrations of Ge-doped-cladding photonic crystal fibres (PCFs) with a view to improving TL yield. Present results concern uncollapsed and collapsed-hole-PCFs.
Keywords
Rutherford backscattering; X-ray photoelectron spectra; dosimetry; electron traps; germanium; holey fibres; ion microprobe analysis; oxidation; photonic crystals; silicon compounds; thermoluminescence; Ge-doped-cladding photonic crystal fibres; PIXE analysis; Rutherford back scattering; SiO2:Ge; X-ray photoelectron spectroscopy; XPS; dopant concentrations; doped silica fibre; electron traps; fibre forming technology; material characteristics; particle-induced X-ray emission; surface oxidation state; thermoluminescence radiation dosimetry; Dosimetry; Educational institutions; Electronic mail; Glass; Optical fibers; Preforms; Silicon compounds; Doped SiO2 fibres; Dosimetry; Particle Induced X-ray Emission; Photonic Crystal Fibre; X-ray Photoelectron Spectroscopy; X-ray photoelectron spectroscopy (XPS); dosimetry; particle-induced X-ray emission (PIXE); photonic crystal fibre (PCF);
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.2015.2406394
Filename
7050239
Link To Document