• DocumentCode
    80778
  • Title

    XPS and PIXE Analysis of Doped Silica Fibre for Radiation Dosimetry

  • Author

    Abdul Sani, S.F. ; Mahdiraji, G. Amouzad ; Siti Shafiqah, A.S. ; Grime, G.W. ; Palitsin, V. ; Hinder, S.J. ; Tamchek, N. ; Abdul Rashid, H.A. ; Maah, M.J. ; Watts, J.F. ; Bradley, D.A.

  • Author_Institution
    Dept. of Phys., Univ. of Surrey, Guildford, UK
  • Volume
    33
  • Issue
    11
  • fYear
    2015
  • fDate
    June1, 1 2015
  • Firstpage
    2268
  • Lastpage
    2278
  • Abstract
    The material characteristics of doped SiO2 fibre are studied, the electron traps in the product medium creating a situation attractive for their application in thermoluminescence (TL) radiation dosimetry. To date, rather limited research has been conducted towards gaining an essential understanding of the magnitude of TL signal and material characteristics of doped fibres. Characterization is being sought to ensure that the mechanism of TL yield in optical fibres is well understood, allowing a favourable well controlled production situation to be established. The intended end point is to specify dosimeters, not only for clinical dosimetry but also for their application in industrial/energy-industry settings. Investigation of the surface oxidation state of the Ge-doped SiO2 optical preform has been carried out using the X-ray photoelectron spectroscopy technique. In a further development using the fibre forming technology, particle-induced X-ray emission/Rutherford back scattering measurements have been employed to ascertain dopant concentrations of Ge-doped-cladding photonic crystal fibres (PCFs) with a view to improving TL yield. Present results concern uncollapsed and collapsed-hole-PCFs.
  • Keywords
    Rutherford backscattering; X-ray photoelectron spectra; dosimetry; electron traps; germanium; holey fibres; ion microprobe analysis; oxidation; photonic crystals; silicon compounds; thermoluminescence; Ge-doped-cladding photonic crystal fibres; PIXE analysis; Rutherford back scattering; SiO2:Ge; X-ray photoelectron spectroscopy; XPS; dopant concentrations; doped silica fibre; electron traps; fibre forming technology; material characteristics; particle-induced X-ray emission; surface oxidation state; thermoluminescence radiation dosimetry; Dosimetry; Educational institutions; Electronic mail; Glass; Optical fibers; Preforms; Silicon compounds; Doped SiO2 fibres; Dosimetry; Particle Induced X-ray Emission; Photonic Crystal Fibre; X-ray Photoelectron Spectroscopy; X-ray photoelectron spectroscopy (XPS); dosimetry; particle-induced X-ray emission (PIXE); photonic crystal fibre (PCF);
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2015.2406394
  • Filename
    7050239