• DocumentCode
    807821
  • Title

    Digital-domain calibration of multistep analog-to-digital converters

  • Author

    Lee, Seung-Hoon ; Song, Bang-Sup

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • Volume
    27
  • Issue
    12
  • fYear
    1992
  • fDate
    12/1/1992 12:00:00 AM
  • Firstpage
    1679
  • Lastpage
    1688
  • Abstract
    A digital-domain self-calibration technique, which can directly measure and cancel code errors in multistep conversions, is developed to improve the linearity of multi-step analog-to-digital converters (ADCs). While conventional self-calibration techniques require separate digital-to-analog converters (DACs) for calibration purpose to subtract nonlinearity errors in the analog domain, the proposed digital calibration technique uses add-on digital logic to subtract nonlinearity errors digitally from uncalibrated digital outputs. In a prototype 12-b fully differential two-step ADC implemented using a 2-μm n-well CMOS technology, this technique cancels MOS switch feedthrough, op-amp offsets, and interstage gain errors simultaneously, and improves total harmonic distortion from -64 to -77 dB
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; calibration; error correction; 2 micron; code errors; digital-domain self-calibration; fully differential two-step ADC; linearity improvement; multistep conversions; n-well CMOS technology; total harmonic distortion; Analog-digital conversion; CMOS logic circuits; CMOS technology; Calibration; Digital-analog conversion; Linearity; Operational amplifiers; Prototypes; Switches; Total harmonic distortion;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.173093
  • Filename
    173093