• DocumentCode
    807833
  • Title

    An oversampling converter for strain gauge transducers

  • Author

    Kerth, Donald A. ; Piasecki, Douglas S.

  • Author_Institution
    Crystal Semicond. Corp., Austin, TX, USA
  • Volume
    27
  • Issue
    12
  • fYear
    1992
  • fDate
    12/1/1992 12:00:00 AM
  • Firstpage
    1689
  • Lastpage
    1696
  • Abstract
    An oversampling converter that directly digitizes low-level strain gauge transducer outputs is presented. An instrumentation amplifier and two independent chopper-stabilized delta-sigma modulators amplify and convert the transducer´s output and excitation. Digital division of the two independent conversions produces a 20-b ratiometric measurement. Drift due to external thermocouple junctions and RF rectification is eliminated by AC excitation of the transducer. Interference (50/60 Hz) is eliminated by a digital FIR filter that has a -3 dB bandwidth of 15 Hz. Offset and gain errors are corrected by digital calibration. The input-referred noise of this converter is 150 nVrms and the linearity is 110 dB. The converter gain and offset drifts are less than 2.5 p.p.m./°C and 15 nV/°C, respectively. This 2-μm CMOS chip consumes 30 mW of power and has an area of 25.5 mm2
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; calibration; delta modulation; error correction; instrumentation amplifiers; strain gauges; 2 micron; 30 mW; AC excitation; CMOS chip; RF rectification; chopper-stabilized delta-sigma modulators; digit division; digital FIR filter; digital calibration; drift elimination; external thermocouple junctions; gain errors; input-referred noise; instrumentation amplifier; offset drifts; oversampling converter; strain gauge transducers; transducer outputs; Bandwidth; Capacitive sensors; Delta modulation; Error correction; Finite impulse response filter; Instruments; Interference elimination; Radio frequency; Radiofrequency amplifiers; Transducers;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.173094
  • Filename
    173094