• DocumentCode
    807839
  • Title

    A 1.2-μm BiCMOS sample-and-hold circuit with a constant-impedance, slew-enhanced sampling gate

  • Author

    Wakayama, Myles H. ; Tanimoto, Hiroshi ; Tasai, Takahiro ; Yoshida, Yoshihiro

  • Author_Institution
    Toshiba Corp., Kawasaki, Japan
  • Volume
    27
  • Issue
    12
  • fYear
    1992
  • fDate
    12/1/1992 12:00:00 AM
  • Firstpage
    1697
  • Lastpage
    1708
  • Abstract
    A new sampling gate circuit, with dual outputs functioning alternately in the track and hold modes, is integrated in an open-loop sample-and-hold circuit architecture achieving greater than 450-MHz small-signal input bandwidth and 100-MHz maximum sample rate. The sampling gate also incorporates slew enhancement techniques to achieve (+430 V/μs, -510 V/μs) slew rate and features a `built-in´ buffer to maintain constant input impedance for both the track and hold modes, simplifying design of the front-end input buffer. Special on-chip clock generation circuits are used to minimize sampled pedestal (+4 mV). Power dissipation is less than 300 mW, including output driver. Measured harmonics are 58 dB down for a 2 Vp-p 20-MHz sine wave sampled at 100 MHz
  • Keywords
    BiCMOS integrated circuits; sample and hold circuits; 1.2 micron; 100 MHz; 300 mW; 450 MHz; BiCMOS; constant-impedance; dual outputs; on-chip clock generation circuits; open loop architecture; sample/hold circuit; slew-enhanced sampling gate; track mode; Bandwidth; BiCMOS integrated circuits; CMOS process; Circuit topology; Clocks; Impedance; MOSFETs; Power dissipation; Sampling methods; Switches;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.173095
  • Filename
    173095