DocumentCode
807867
Title
Neutron Damage Failure Rates for Large Populations
Author
Holmes, R.R. ; Wilson, D.K. ; Blair, R.R.
Author_Institution
Bell Laboratories Whippany, New Jersey 07981
Volume
19
Issue
6
fYear
1972
Firstpage
414
Lastpage
417
Abstract
The distribution of damage produced by individual 14 MeV neutron events was investigated experimentally. These results were used to establish limits on the probability of failure in large device populations. It was concluded that the damage margin required to allow for extra damaging events is less than 40%, with most systems requiring a margin of less than 15%.
Keywords
Brightness; Dark current; Diodes; Displays; Electron beams; Electron optics; Neutrons; Optical scattering; Photoconductivity; Silicon;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1972.4326867
Filename
4326867
Link To Document