• DocumentCode
    807867
  • Title

    Neutron Damage Failure Rates for Large Populations

  • Author

    Holmes, R.R. ; Wilson, D.K. ; Blair, R.R.

  • Author_Institution
    Bell Laboratories Whippany, New Jersey 07981
  • Volume
    19
  • Issue
    6
  • fYear
    1972
  • Firstpage
    414
  • Lastpage
    417
  • Abstract
    The distribution of damage produced by individual 14 MeV neutron events was investigated experimentally. These results were used to establish limits on the probability of failure in large device populations. It was concluded that the damage margin required to allow for extra damaging events is less than 40%, with most systems requiring a margin of less than 15%.
  • Keywords
    Brightness; Dark current; Diodes; Displays; Electron beams; Electron optics; Neutrons; Optical scattering; Photoconductivity; Silicon;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1972.4326867
  • Filename
    4326867