Title :
Correction of errors owing to thermal elongation of high temperature coaxial probe for microwave permittivity measurement
Author :
Arai, M. ; Binner, J.G.P. ; Cross, T.E.
Author_Institution :
Dept. of Mater. Eng. & Mater. Design, Nottingham Univ., UK
fDate :
7/6/1995 12:00:00 AM
Abstract :
A method for correcting errors owing to the thermal elongation of high temperature coaxial probe for microwave permittivity measurement has been developed. The method has been verified by measuring the open circuit permittivity of the probe which operates up to 1200°C
Keywords :
high-temperature techniques; measurement errors; microwave measurement; permittivity measurement; 1200 C; dielectric measurement; high temperature coaxial probe; measurement error correction; microwave permittivity measurement; open circuit permittivity; thermal elongation;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19950780
