DocumentCode
808074
Title
Experimental investigation of quantum key distribution through transparent optical switch elements
Author
Toliver, Paul ; Runser, Robert J. ; Chapuran, Thomas E. ; Jackel, Janet L. ; Banwell, Thomas C. ; Goodman, Matthew S. ; Hughes, Richard J. ; Peterson, Charles G. ; Derkacs, Derek ; Nordholt, Jane E. ; Mercer, Linden ; McNown, Scott ; Goldman, Art ; Blake,
Author_Institution
Telcordia Technol., USA
Volume
15
Issue
11
fYear
2003
Firstpage
1669
Lastpage
1671
Abstract
Quantum key distribution (QKD) enables unconditional physical layer security for the distribution of cryptographic key material. However, most experimental demonstrations have relied on simple point-to-point optical links. In this paper we investigate the compatibility of QKD with reconfigurable optical networks. By performing the first tests of QKD transmission through optical switches, we study if there are impairment mechanisms other than switch insertion loss that impact the sifted and error corrected secret bit yield. Three types of transparent optical switch elements are investigated including lithium niobate (LiNbO/sub 3/), microelectromechanical systems (MEMS), and optomechanical. We show that QKD can be extended beyond point-to-point links to switched multinode architectures including protected ring networks to enhance quantum channel availability.
Keywords
electro-optical switches; error correction; lithium compounds; micro-optics; microswitches; optical fibre communication; optical losses; optical switches; quantum cryptography; telecommunication security; LiNbO/sub 3/; MEMS; compatibility; cryptographic key material; error corrected secret bit yield; impairment mechanisms; lithium niobate microelectromechanical systems; optical switches; optomechanical switch elements; protected ring networks; quantum channel availability; quantum key distribution; reconfigurable optical networks; sifted secret bit yield; simple point-to-point optical links; switch insertion loss; switched multinode architectures; transparent optical switch elements; unconditional physical layer security; Cryptography; Insertion loss; Optical fiber communication; Optical fiber networks; Optical losses; Optical materials; Optical switches; Performance evaluation; Physical layer; Testing;
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2003.818687
Filename
1237624
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