• DocumentCode
    808074
  • Title

    Experimental investigation of quantum key distribution through transparent optical switch elements

  • Author

    Toliver, Paul ; Runser, Robert J. ; Chapuran, Thomas E. ; Jackel, Janet L. ; Banwell, Thomas C. ; Goodman, Matthew S. ; Hughes, Richard J. ; Peterson, Charles G. ; Derkacs, Derek ; Nordholt, Jane E. ; Mercer, Linden ; McNown, Scott ; Goldman, Art ; Blake,

  • Author_Institution
    Telcordia Technol., USA
  • Volume
    15
  • Issue
    11
  • fYear
    2003
  • Firstpage
    1669
  • Lastpage
    1671
  • Abstract
    Quantum key distribution (QKD) enables unconditional physical layer security for the distribution of cryptographic key material. However, most experimental demonstrations have relied on simple point-to-point optical links. In this paper we investigate the compatibility of QKD with reconfigurable optical networks. By performing the first tests of QKD transmission through optical switches, we study if there are impairment mechanisms other than switch insertion loss that impact the sifted and error corrected secret bit yield. Three types of transparent optical switch elements are investigated including lithium niobate (LiNbO/sub 3/), microelectromechanical systems (MEMS), and optomechanical. We show that QKD can be extended beyond point-to-point links to switched multinode architectures including protected ring networks to enhance quantum channel availability.
  • Keywords
    electro-optical switches; error correction; lithium compounds; micro-optics; microswitches; optical fibre communication; optical losses; optical switches; quantum cryptography; telecommunication security; LiNbO/sub 3/; MEMS; compatibility; cryptographic key material; error corrected secret bit yield; impairment mechanisms; lithium niobate microelectromechanical systems; optical switches; optomechanical switch elements; protected ring networks; quantum channel availability; quantum key distribution; reconfigurable optical networks; sifted secret bit yield; simple point-to-point optical links; switch insertion loss; switched multinode architectures; transparent optical switch elements; unconditional physical layer security; Cryptography; Insertion loss; Optical fiber communication; Optical fiber networks; Optical losses; Optical materials; Optical switches; Performance evaluation; Physical layer; Testing;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2003.818687
  • Filename
    1237624