Title :
Adaptive, learning, and pattern recognition systems: Theory and applications
Author_Institution :
Yale University, New Haven, CT, USA
fDate :
4/1/1972 12:00:00 AM
Keywords :
Adaptive systems; Book reviews; Learning systems; Pattern recognition; Books; Convergence; Data mining; Delay lines; Learning automata; Linear systems; Matrix decomposition; Particle measurements; Pattern recognition; Stochastic processes;
Journal_Title :
Automatic Control, IEEE Transactions on
DOI :
10.1109/TAC.1972.1099923
