• DocumentCode
    808206
  • Title

    Low frequency noise in separate absorption, grading, charge and multiplication (SAGCM) avalanche photodiodes

  • Author

    Zhao, X. ; Deen, M.J. ; Tarof, L.E.

  • Author_Institution
    Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC, Canada
  • Volume
    32
  • Issue
    3
  • fYear
    1996
  • fDate
    2/1/1996 12:00:00 AM
  • Firstpage
    250
  • Lastpage
    252
  • Abstract
    Low frequency noise spectra of five SAGCM APDs were measured. The experimental noise current spectra were fitted with SI=AFIdx/fy+2qI dMeff. Any enhancement in shot noise was included in Meff. The AF factors were found to vary from 10 -7 to 10-5 and were related to the I-V characteristics of these APDs
  • Keywords
    1/f noise; avalanche photodiodes; semiconductor device noise; shot noise; I-V characteristics; SAGCM APDs; low frequency noise; noise current spectra; separate absorption grading charge and multiplication avalanche photodiodes; shot noise;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19960173
  • Filename
    490833
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=808206