DocumentCode :
808283
Title :
50 Ω noise measurements with full receiver calibration without tuner
Author :
Crozat, P. ; Boutez, C. ; Chaubet, M. ; Danelon, V. ; Sylvestre, A. ; Vernet, G.
Author_Institution :
Inst. d´´Electron. Fondamentale, Univ. de Paris-Sud, Orsay, France
Volume :
32
Issue :
3
fYear :
1996
fDate :
2/1/1996 12:00:00 AM
Firstpage :
261
Lastpage :
262
Abstract :
A 50 Ω high frequency noise measurement has been developed. A new approach for calculating the four noise parameters is presented. This method necessitates no isolator and has broadband capacities. Receiver calibration and F50 HEMT measurements are presented
Keywords :
calibration; electric noise measurement; high electron mobility transistors; semiconductor device noise; semiconductor device testing; HEMT measurements; HF noise measurements; broadband capacities; full receiver calibration; high frequency noise;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19960146
Filename :
490840
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=808283
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