DocumentCode
808294
Title
Measurement of refractive index of GaSb (1.8 to 2.56 μm) using a prism
Author
Uribe, M. Munoz ; de Oliveira, C.E.M. ; Clerice, J.H. ; Miranda, R.S. ; Zakia, M.B. ; de Carvalho, M.M.G. ; Patel, N.B.
Author_Institution
Inst. de Fisica Gleb Wataghin, Univ. Estadual de Campinas, Sao Paulo, Brazil
Volume
32
Issue
3
fYear
1996
fDate
2/1/1996 12:00:00 AM
Firstpage
262
Lastpage
264
Abstract
The authors have measured the refractive index of GaSb for the transparent region from 1.8 to 2.56 μm using refraction in a prism. The values obtained agree well with those recently measured by the authors using ellipsometry. A good fit to the experimental data is obtained using the single oscillator model
Keywords
III-V semiconductors; gallium compounds; optical prisms; refractive index; refractive index measurement; 1.8 to 2.56 micron; GaSb; prism; refraction; refractive index measurement; single oscillator model; transparent region;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19960176
Filename
490841
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