Title :
Measurement of refractive index of GaSb (1.8 to 2.56 μm) using a prism
Author :
Uribe, M. Munoz ; de Oliveira, C.E.M. ; Clerice, J.H. ; Miranda, R.S. ; Zakia, M.B. ; de Carvalho, M.M.G. ; Patel, N.B.
Author_Institution :
Inst. de Fisica Gleb Wataghin, Univ. Estadual de Campinas, Sao Paulo, Brazil
fDate :
2/1/1996 12:00:00 AM
Abstract :
The authors have measured the refractive index of GaSb for the transparent region from 1.8 to 2.56 μm using refraction in a prism. The values obtained agree well with those recently measured by the authors using ellipsometry. A good fit to the experimental data is obtained using the single oscillator model
Keywords :
III-V semiconductors; gallium compounds; optical prisms; refractive index; refractive index measurement; 1.8 to 2.56 micron; GaSb; prism; refraction; refractive index measurement; single oscillator model; transparent region;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19960176
