Title :
Effective resolution of analog to digital converters
Author :
Hejn, Konrad ; Pacut, Andrzej
Author_Institution :
Autom. Meas. Syst. Group, Warsaw Univ. of Technol., Poland
Abstract :
ADCs have always been bottlenecks in electronic systems. Currently, ADCs are often integrated on a semiconductor substrate with other mixed-signal circuits. This creates a need for clever strategies for error measurement and correction. This paper describes an analytical method which allows implementation of the necessary test on-cell. The main requirement is to produce a high-quality sine wave on the board. The parameters of this effective resolution measurement procedure can be easily (in real time) accumulated by typical digital circuitry.
Keywords :
analogue-digital conversion; error correction; integrated circuit measurement; integrated circuit testing; mixed analogue-digital integrated circuits; real-time systems; ADC; IC measurement; IC test; analog to digital converters; effective resolution measurement procedure; error correction; error measurement; high-quality sine wave generation; mixed-signal circuits; on-cell test; real time measurement system; Analog-digital conversion; Band pass filters; Distortion measurement; Filtering; Measurement errors; Power harmonic filters; Sampling methods; Spectral analysis; Table lookup; Testing;
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
DOI :
10.1109/MIM.2003.1238348
